| JEOL High Resolution Electron Microscope |
 |
 |
 |
Description
JEOL
2010 EX HREM with Oxford-Link EDS,Gatan Digital Micrograph equipped
with slow scan CCD camera
Capabilities Point resolution
1.9 Å, line resolution 1.4 Å.The instrument has an information
limit of about 0.14nm and permits simultaneous high-resolution imaging
and nanometer-level spectroscopic analysis.
Related links Examples of Data Obtained To schedule time on this instrument, learn more about its capabilities and user fees etc. please contact Huifang Xu, Sr Research Scientist I, Earth and Planetary Sciences Mr. Rick Bradley, Nanoscience Lab Manager, |