| JEOL FIELD EMISSION STEM/TEM |
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Description
JEOL
2010 FEG TEM STEM with Oxford EDS,Gatan Imaging Filter and EEL Spectrometer
Capabilities Point resolution
1.9 Å, line resolution 1.4 Å, STEM ADF mode resolution
1.4 Å.The instrument can produce a high-brightness 1nm diameter
probe and has an information limit of about 0.14nm, which permits
simultaneous high-resolution imaging and nanometer-level spectroscopic
analysis.
Related links JEOL
Examples of Data Obtained To schedule time on this instrument, learn more about its capabilities and user fees etc. please contact Huifang Xu, Sr Research Scientist I, Earth and Planetary Sciences Mr. Rick Bradley, Nanoscience Lab Manager, |