Scanning Electron Microscope

 

 

Description
SEM, JOEL-5800LV with EDS

Capabilities
Has resolution of 3.0nm in high vaccum mode and 4.5nm in the low vaccum mode.Voltage range is 0.3kv-30kv.Can work under pressures of upto 200 milliTorr.The low vacuum mode allows imaging and analysis of samples that do not have to be dried and coated before hand. This is particularly useful for handling "wet" samples such as soil, sandstone, and clay.

Related links

JEOL.
Hrem
NY state


Examples of Data Obtained

To schedule time on this instrument, learn more about its capabilities and user fees etc. please contact

Mike spilde

Mr. Rick Bradley, Nanoscience Lab Manager,
505 272 7648, e-mail: rbradley@chtm.unm.edu