| JEOL 6400F FE SEM |
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Description
Capabilities This SEM has a nominal
resolution of 2nm(realistically 20nm).It has a 6" load lock
but can take upto 8" samples.It also has a microchannel plate
,backscatter detector and secondary electron detector.
Related links Examples of Data Obtained To schedule time on this instrument, learn more about its capabilities and user fees etc. please contact Dr. Kevin Malloy, Professor, Electrical
& Computer Engr Mr. Rick Bradley, Nanoscience Lab Manager, |