EPMA

JEOL 8200 Microprobe



Description
JEOL 8200 microprobe with 5 wavelength dispersive (WD) spectrometers and an ultrathin-window energy dispersive spectrometer.


Capabilities
Two spectrometers are high sensitivity detectors and one spectrometer has a large PET crystal suitable for precise measurement of Pb, Th, U at low concentrations. It provides superior spot resolution for imaging and analysis of small particles using a LaB6 gun .It is an ideal system for both major and trace element investigation and analysis of light elements.It can provide high resolution and high sensitivity X-ray maps over entire thin sections.


Related links
JEOL
 
To schedule time on this instrument, learn more about its capabilities and user fees etc. please contact

Mike Spilde, Research Scientist III, Institute of Meteoritics
505 277 5430, email: mspilde@unm.edu
Mr. Rick Bradley, Nanoscience Lab Manager,
505 272 7648, e-mail: rbradley@chtm.unm.edu



facilities