EPMA
JEOL 8200 Microprobe
Description
JEOL
8200 microprobe with 5 wavelength dispersive (WD) spectrometers and an
ultrathin-window energy dispersive spectrometer.
Capabilities
Two
spectrometers are high sensitivity detectors and one spectrometer has a
large PET crystal suitable for precise measurement of Pb, Th, U at low
concentrations. It provides superior spot resolution for imaging and
analysis of small particles using a LaB6 gun .It is an ideal system for
both major and trace element investigation and analysis of light
elements.It can provide high resolution and high sensitivity X-ray maps
over entire thin sections.
Related links
To schedule time on this instrument, learn more about its capabilities and user fees etc. please contact
Mike Spilde, Research Scientist III, Institute of Meteoritics
505 277 5430, email: mspilde@unm.edu
Mr. Rick Bradley, Nanoscience Lab Manager,
505 272 7648, e-mail: rbradley@chtm.unm.edu