| JEOL 8200 Microprobe |
 |
 |
 |
Description
JEOL
8200 microprobe with 5 wavelength dispersive (WD) spectrometers
and an ultrathin-window energy dispersive spectrometer.
Capabilities Two spectrometers
are high sensitivity detectors and one spectrometer has a large
PET crystal suitable for precise measurement of Pb, Th, U at low
concentrations. It provides superior spot resolution for imaging
and analysis of small particles using a LaB6 gun .It is an ideal
system for both major and trace element investigation and analysis
of light elements.It can provide high resolution and high sensitivity
X-ray maps over entire thin sections.
Related links JEOL
Examples of Data Obtained To schedule time on this instrument, learn more about its capabilities and user fees etc. please contact Mike Spilde, Research Scientist III, Institute
of Meteoritics Mr. Rick Bradley, Nanoscience Lab Manager, |