SEM Facilities provided at cmem-unm
SEM, JEOL-5800LV with EDSDescription:
Has resolution of 3.0nm in high vaccum mode and 4.5nm in the low vaccum mode. Voltage range is 0.3kv-30kv.Can work under pressures of upto 200 milliTorr. The low vacuum mode allows imaging and analysis of samples that do not have to be dried and coated before hand. This is particularly useful for handling "wet" samples such as soil, sandstone, and clay.
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Related links:
JEOL
Hrem
NY state
To schedule time on this instrument, learn more about its capabilities and user fees etc. please contact:
Mike Spilde, Research Scientist III, Institute of Meteoritics
505 277 5430, email: mspilde@unm.edu
Mr. Rick Bradley, Nanoscience Lab Manager,
505 272 7648, e-mail: rbradley@chtm.unm.edu
Hitachi S-5200 Nano SEM
Description:
It is the highest resolution SEM available today. The magnification range goes from 100 X to 2,000,000 X. It is capable of remote access using the Quartz PCI Image acquisition system. The PGT EDS system will be installed in March 2004. It is ideally suited for observation of non conductive materials such as ceramics, polymers, catalysts, biological materials and semiconductors. The instrument will be accessible via a web based interface. Guaranteed resolution at 1 kV is 1.7 nm and at 30 kV is 0.5 nm
Related links:
Further info, please contact:
Geoff Courtin, Research Engineer II: Chemical & Nuclear
Engineering
505 277 5515, email: gcourtin@unm.edu
505 272 7648, e-mail: rbradley@chtm.unm.edu
Hitachi S-5200 Nano SEM
Description:
Resolution is 2 nm at 1 kV and 0.5 nm at 30 kV. Magnification ranges from 100 X to 1,000,000 X. Includes a PGT Spirit software for EDS analysis. It is ideally suited for non-conductive materials such as ceramics, catalysts, polymers, biological materials, and semiconductors. Remote access is available using the Quartz PCI Image Server.
PGT Spirit Software
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Using the spotlighting analysis mode, you can select a number of specific regions within a live image and generate a separate spectrum for each consecutively numbered tagged area.
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The X-ray elemental mapping analysis mode is used to qualitatively show the distribution and concentration of individual elements contained in the sample.
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Using
the PTS mode, you can do further
analyses such as extracting spectra
using annotations.
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This web interface gives several possibilities. You can submit a new job, or search for existing jobs or data from which you can retrieve your images securely. The Quartz PCI server website is available after the SEM administrator has set up a user account by going to sem.unm.edu.
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You will be able to see the live image of the lab, the live SEM image or the EDS monitor. You can then interact with the SEM operator via telephone by calling (505) 277-1428. As images are collected, you will see each image on the panel on the right from which you can then download onto any computer.
Related links:Hitachi
Bruker AXS
Research Assistant Professor
Ceramic and
(505) 277-5717
Email: hipham@unm.edu
Research Engineer II
Chemical & Nuclear
Engineering
(505) 277-1335
Email: gcourtin@unm.edu
NNIN Lab Manager; Nanoscience
Director at Center for High Tech Materials
(505) 272-7648
Email: rbradley@chtm.unm.edu
SEM:
Description:
This SEM has a nominal resolution of 2nm(realistically 20nm).It has a 6" load lock but can take upto 8" samples.It also has a microchannel plate ,backscatter detector and secondary electron detector.

For more info, contact:
Dr. Kevin Malloy, Professor, Electrical & Computer Engr
505 272 7868, email: malloy@chtm.unm.edu
Mr. Rick Bradley, Nanoscience Lab Manager,
505 272 7648, e-mail: rbradley@chtm.unm.edu
For more information, please contact us (details on contact page).






