SEM Facilities provided at cmem-unm

SEM, JEOL-5800LV with EDS

Description:
Has resolution of 3.0nm in high vaccum mode and 4.5nm in the low vaccum mode. Voltage range is 0.3kv-30kv.Can work under pressures of upto 200 milliTorr. The low vacuum mode allows imaging and analysis of samples that do not have to be dried and coated before hand. This is particularly useful for handling "wet" samples such as soil, sandstone, and clay.

SEM
Scanning Electron Microscope @ UNM

Related links:
JEOL
Hrem
NY state

To schedule time on this instrument, learn more about its capabilities and user fees etc. please contact:

Mike Spilde, Research Scientist III, Institute of Meteoritics
505 277 5430, email: mspilde@unm.edu

Mr. Rick Bradley, Nanoscience Lab Manager,
505 272 7648, e-mail: rbradley@chtm.unm.edu



Hitachi S-5200 Nano SEM

Description:
It is the highest resolution SEM available today. The magnification range goes from 100 X to 2,000,000 X. It is capable of remote access using the Quartz PCI Image acquisition system. The PGT EDS system will be installed in March 2004. It is ideally suited for observation of non conductive materials such as ceramics, polymers, catalysts, biological materials and semiconductors. The instrument will be accessible via a web based interface. Guaranteed resolution at 1 kV is 1.7 nm and at 30 kV is 0.5 nm

SEM

Related links:
Hitachi

Examples of data obtained:
link to the examples

Further info, please contact:
Geoff Courtin, Research Engineer II: Chemical & Nuclear Engineering
505 277 5515, email: gcourtin@unm.edu

Mr. Rick Bradley, Nanoscience Lab Manager,

505 272 7648, e-mail: rbradley@chtm.unm.edu



Hitachi S-5200 Nano SEM


Description:
Resolution is 2 nm at 1 kV and 0.5 nm at 30 kV.  Magnification ranges from 100 X to 1,000,000 X.  Includes a PGT Spirit software for EDS analysis.  It is ideally suited for non-conductive materials such as ceramics, catalysts, polymers, biological materials, and semiconductors.  Remote access is available using the Quartz PCI Image Server.

PGT Spirit Software

In addition to acquiring a spectrum, this software has other features such as elemental mapping, linescan and spotlighting for EDS analysis.  It also has the award-winning position-tagged spectrometry (PTS), a technique for tagging each X-ray photon with the measured energy and X-Y coordinates.  By using the PTS, you can open files at a later time for further analyses such as extracting a linescan or extracting elemental mappings.

 Examples:

                                                                                                                   


Using the spotlighting analysis mode, you can select a number of specific regions within a live image and generate a separate spectrum for each consecutively numbered tagged area.   

                 An example of using the spotlighting mode on a Nb-Si mixed oxide sample.  The number labeled for each of the particles on the SEM image corresponds to the extension filename of the EDS spectra.  For example, the particle labeled 1 on the image corresponds to the EDS spectra with the extension filename T001.  Therefore, the particle labeled 1 is comprised of mostly silica, while the other labeled particles are mostly comprised of niobium oxide.  




The X-ray elemental mapping analysis mode is used to qualitatively show the distribution and concentration of individual elements contained in the sample.

                 An example of using mapping on a Nb-Si mixed oxide sample.  Niobium, silicon, oxygen, sodium and carbon mappings are obtained for this SEM image.  The bright magenta areas where there are more niobium counts relative to the silicon counts contain mostly niobium.  The bright blue areas where there are more silicon counts relative to the niobium counts contain mostly silicon.  

              
        
 

Using the PTS mode, you can do further analyses such as extracting spectra using annotations.

                 An example of using the PTS mode on a Pd/Al2O3 physically mixed with ZnO.  A spectrum is generated for each annotation objects of the same color.  Each spectrum contains a colored stripe corresponding to the color of the region from which it was generated.  The red and green regions contain more zinc relative to aluminum, whereas the yellow region contains more aluminum relative to zinc.      

 Quartz PCI Image Server

 This server has a remote access feature both for collaboration with SEM operators and for secure image retrieval purposes.   

                     
                 

            This web interface gives several possibilities. You can submit a new job, or search for existing jobs or data from which you can retrieve your images securely.  The Quartz PCI server website is available after the SEM administrator has set up a user account by going to sem.unm.edu.

            The web interface also provides the possibility of interacting with the SEM operator. With the Collaborate button you will be able to select between sessions for which the SEM operator activated this feature.

   

        You will be able to see the live image of the lab, the live SEM image or the EDS monitor. You can then interact with the SEM operator via telephone by calling (505) 277-1428. As images are collected, you will see each image on the panel on the right from which you can then download onto any computer.

Related links:
Hitachi
Bruker AXS

 For further information or to schedule time and training, please contact:

Hien Pham, PhD
Research Assistant Professor
Ceramic and Composite Materials Center; Chemical & Nuclear Engineering
(505) 277-5717
Email: hipham@unm.edu

Geoff Courtin
Research Engineer II
Chemical & Nuclear Engineering
(505) 277-1335
Email: gcourtin@unm.edu

Rick Bradley
NNIN Lab Manager; Nanoscience Director at Center for High Tech Materials
(505) 272-7648
Email: rbradley@chtm.unm.edu



SEM:

Description:
This SEM has a nominal resolution of 2nm(realistically 20nm).It has a 6" load lock but can take upto 8" samples.It also has a microchannel plate ,backscatter detector and secondary electron detector.


For more info, contact:

Dr. Kevin Malloy, Professor, Electrical & Computer Engr
505 272 7868, email: malloy@chtm.unm.edu

Mr. Rick Bradley, Nanoscience Lab Manager,
505 272 7648, e-mail: rbradley@chtm.unm.edu


For more information, please contact us (details on contact page).

facilities