TEM
TEM Facilities provided at cmem-unm
JEOL 2010 FEG TEM STEM with Oxford EDS,Gatan Imaging Filter and EEL SpectrometerDescription:
Point resolution 1.9 Amstrongs, line resolution 1.4 Amstrong, STEM ADF mode resolution 1.4 Amstrongs. The instrument can produce a high-brightness 1nm diameter probe and has an information limit of about 0.14nm, which permits simultaneous high-resolution imaging and nanometer-level spectroscopic analysis.
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Related links:
JEOL
To schedule time on this instrument, learn more about its capabilities and user fees etc. please contact:
Huifang Xu, Sr Research Scientist I, Earth and Planetary Sciences
505 277-7536, email: hfxu@unm.edu
Mr. Rick Bradley, Nanoscience Lab Manager,
505 272 7648, e-mail: rbradley@chtm.unm.edu
JEOL 2010 EX HREM with Oxford-Link EDS,Gatan Digital Micrograph equipped with slow scan CCD camera
Description:
Point resolution 1.9 Ã…, line resolution 1.4 Ã….The instrument has an information limit of about 0.14nm and permits simultaneous high-resolution imaging and nanometer-level spectroscopic analysis.
Related links:
Huifang Xu, Sr Research Scientist I, Earth and Planetary Sciences
505 277-7536, email: hfxu@unm.edu
Mr. Rick Bradley, Nanoscience Lab Manager,
505 272 7648, e-mail: rbradley@chtm.unm.edu