EPMA

JEOL 8200 Microprobe

Description:
JEOL 8200 microprobe with 5 wavelength dispersive (WD) spectrometers and an ultrathin-window energy dispersive spectrometer.

Capabilities:
Two spectrometers are high sensitivity detectors and one spectrometer has a large PET crystal suitable for precise measurement of Pb, Th, U at low concentrations. It provides superior spot resolution for imaging and analysis of small particles using a LaB6 gun .It is an ideal system for both major and trace element investigation and analysis of light elements.It can provide high resolution and high sensitivity X-ray maps over entire thin sections.

SEM

Related links:
JEOL

To schedule time on this instrument or to learn more about its capabilities and user fees etc. please contact:

Mike Spilde, Research Scientist III, Institute of Meteoritics
505 277 5430, email: mspilde@unm.edu

Mr. Rick Bradley, Nanoscience Lab Manager,
505 272-7648, e-mail: rbradley@chtm.unm.edu