TEM Facilities provided at cmem-unm
JEOL 2010 FEG TEM STEM with Oxford EDS,Gatan Imaging Filter and EEL Spectrometer
Description:
Point resolution 1.9 Amstrongs, line resolution 1.4 Amstrong, STEM ADF mode resolution 1.4 Amstrongs. The instrument can produce a high-brightness 1nm
diameter probe and has an information limit of about 0.14nm, which permits simultaneous high-resolution imaging and nanometer-level spectroscopic
analysis.
Related links:
To schedule time on this instrument or to learn more about its capabilities and user fees etc. please contact:
Ying-Bing Jiang, Research Scientist, Chemical & Nuclear Engineering
Phone: 505 277-7536
Email: ybjiang@unm.edu
JEOL 2010 EX HREM with Oxford-Link EDS,Gatan Digital Micrograph equipped with slow scan CCD camera
Description:
Point resolution 1.9 Å, line resolution 1.4 Å.The instrument has an information limit of about 0.14nm and permits simultaneous high-resolution
imaging and nanometer-level spectroscopic analysis.
To schedule time on this instrument or to learn more about its capabilities and user fees etc. please contact:
Ying-Bing Jiang, Research Scientist, Chemical & Nuclear Engineering
Phone: 505 277-7536
Email: ybjiang@unm.edu
