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David J. Kissel

Biography:

Dave Kissel completed his undergraduate work at the University of Florida and received his bachelor of science in materials science and engineering with a specialty in polymers in 2004. He got his master of science in chemical engineering in 2007 from the university of New Mexico. He now purues a Ph.D. in nanoscience and microsystems with specialties in chemical engineering and materials chemistry. His primary areas of study are materials science, polymers, mechanical property and behavior characterization of nanomaterials, high precision mass sensing, water adsorption behavior, superhydrophobic materials, and sol-gel chemistry and physics.

Resume

 

Mechanical Properties Characterization of Sol-Gel Derived Nanomaterials using an Acoustic Wave Technique - Master's Thesis - By Dave Kissel
Abstract
Sol-gel materials continue to attract attention for a variety of applications; this most likely is due to the versatility of their processing and the ease with which their properties may be tailored to fit a particular application. The effect of this tailoring on mechanical behavior has been characterized here. There existed few studies which characterized the thin film mechanical behavior of polysilicate aerogels, prepared using the sol-gel process. Two series of materials were prepared, derivatized with silylating agents, processed into coating solutions, and characterized with respect to wetting behavior and mechanical properties. Mechanical properties and wetting behavior were characterized using an acoustic wave technique and contact angle measurements, respectively. In one case, superhydrophobicity resulted from the surface reaction step. An identified expense of amplifying the water contact angle was Young’s modulus. This most likely was caused by the increased porosity imparted to the films by the silylating agents. Based upon the gathered data, mechanical strength decreased with the degree of silylated surface goups. A second objective was to prepare an experimental apparatus that could be used for measuring thin film properties such as Young’s modulus and Poisson’s ratio easily and accurately. Motivation for this objective was provided by the costly devices required when employing more conventional methods such as nanoindentation. In addition, measuring Poisson’s ratio directly has been noted as a difficult task. These acoustic techniques make use of standard surface acoustic wave (SAW) devices to generate and detect bulk waves, indicative of mechanical properties, thus allowing for the mechanical property characterization of thin film materials. Considering how these types of measurements usually are performed, the technique itself is novel. Acoustic waves are used as nondestructive mechanical testing probes for the thin films studied. The quality of the method was evaluated using two standard molecular weight polymer samples, poly(styrene) and poly(methyl methacrylate). Resulting mechanical property data agreed well with literature values for the standard polymers. A third polymer, poly(n-butyl methacrylate) was studied in thin film form using the qualified experimental setup. Mechanical property data obtained was consistent with the molecular weight reported by the manufacturers of the polymers. This method did not result in different mechanical property values for varied thicknesses, setting it apart from conventional methods for thin film mechanical property characterization. Since the method was determined to be suitable, the mechanical properties of aerogel thin films were characterized.

Sub-10 nm Thick Microporous Membranes Made by Plasma-Defined Atomic Layer Deposition of a Bridged Silsesquioxane Precursor [PDF]

Ying-Bing Jiang, George Xomeritakis, Zhu Chen, Darren Dunphy, David J. Kissel, Joseph L. Cecchi, and C. Jeffrey Brinker

Journal of American Chemical Society, Nov 23, 2007, vol. 129, p. 15446-15447

Modulus–density scaling behaviour and framework architecture of nanoporous self-assembled silicasModulus–density scaling behaviour and framework architecture of nanoporous self-assembled silicas [PDF]
Hongyou Fan, Christopher Hartshorn, Thomas Buchheit, David Tallant, Roger Assink, Regina Simpson, Dave J. Kissel, Daniel J. Lacks, Salvatore Torquato, and C. Jeffrey Brinker
Nature Materials, June 2007, 6, p. 418-423